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Counterfeit Electronics Symposium

Jun
26

Counterfeit Electronics Symposium

We’re looking forward to presenting and exhibiting at the upcoming Symposium on Counterfeit Parts and Materials. We’ll be in booth #1. Our paper “The Next Challenge For X-Ray Counterfeit Detection: Electronic Equipment” will show new challenges OEMs are facing with elaborate counterfeit schema.

Abstract:

For the past years our R&D team has presented new algorithms and technologies related to the use of x-ray inspection to identify counterfeit electronic components. Although a critical part of the electronic industry’s value chain, single components are not the only target of criminal enterprises. This year our presentation will focus on another equally important stage of the value chain: electronic equipment. The work presented reflects research and development of hardware, software, and algorithms needed to perform x-ray inspection of routers, switches, and other high monetary value equipment. In specific, we will focus on a case study where a number of routers and switches that were not only counterfeited, but also replaced with other electronics. X-ray images of these devices will be presented, as well as the algorithms utilized to assess the authenticity of these equipment.

About the Author:

Dr. Bill Cardoso is the President of Creative Electron. He holds a MS and PhD degrees from the Illinois Institute of Technology (IIT) and an MBA from The University of Chicago. An industry thought leader, Bill has been recognized as IIT's 2011 Outstanding Young Alumnus Awardee for his contributions to science and technology. He is also a Senior member of the Institute of Electrical and Electronics Engineers (IEEE), Surface Mount Technology Association (SMTA), American Physics Society (APS), and the International Society for Optics and Photonics (SPIE). Bill is a holder of several patents in the areas of radiation detection, radiography, and quality inspection.

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