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Find Counterfeit Components with TruView X-Ray Inspection Reel-to-Reel

Feb
24

Find Counterfeit Components with TruView X-Ray Inspection Reel-to-Reel

The success of our global economy relies on the free flow of information and products across multiple geographical boundaries. In a networked society, markets transcend political borders to reach every corner of the globe. With such connectivity come serious challenges to protect the homeland from foreign and domestic threats. The influx of counterfeit electronic components in our supply chain is an ever-increasing threat to our economy. The latest report issued by the US Department of Commerce states that the number of counterfeit incidents almost tripled between 2005 and 2008.

Radiography (or x-ray inspection) is a ubiquitous technique to all recent and upcoming counterfeit component detection standards, including IDEA 1010B, CCAP 101, AS5553, AS6081, and AS6171. X-ray inspection gives you the unique ability to “see” what is inside an electronic component without damaging it.

TruView X-Ray Inspection Reel-to-Reel System

TruView X-Ray inspection system with embedded Reel-to-Reel System

Our team has been working for several years to bring to market solutions that allow our customers to inspect 100% of parts in tape and reel, tubes, and trays. We are proud to share with you today that another major step in our patent-pending Reel-to-Reel (R2R) system was completed: it is faster than ever! Not long ago it took our R2R over 30 minutes to inspect 1,000 parts. That was a breakthrough at the time, but we were not satisfied. Continuous work on this technology have lead us to a new R2R system that can inspect up to 1,000 parts in 5 minutes. This performance allows our partners to drive up inspection of components, thus greatly reducing the chances counterfeit components will be inserted in the supply chain. For more details please take a look at the following video:

About the Author:

Dr. Bill Cardoso is the President of Creative Electron. He holds a MS and PhD degrees from the Illinois Institute of Technology (IIT) and an MBA from The University of Chicago. An industry thought leader, Bill has been recognized as IIT's 2011 Outstanding Young Alumnus Awardee for his contributions to science and technology. He is also a Senior member of the Institute of Electrical and Electronics Engineers (IEEE), Surface Mount Technology Association (SMTA), American Physics Society (APS), and the International Society for Optics and Photonics (SPIE). Bill is a holder of several patents in the areas of radiation detection, radiography, and quality inspection.

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