Creative Electron » The All New TruView™ Fusion
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The All New TruView™ Fusion

We are happy to announce the launch of our new x-ray inspection platform, the TruView™ Fusion! This platform replaces the Number Series (TruView™ 100, 200, 180, etc.). The TruView™ Fusion comes equipped with state of the art software that automatically takes an x-ray image of the whole stage so you can Point-and-Click navigate your inspection using the x-ray image of your entire board. You can also do the same using the optical image of the stage – via an automated vision system installed in the system. These inspection packages make automated batch inspection a simple and easy drag and drop operation!
The TruView™ Fusion also has a tilt compensation system for oblique view inspection. The stage rotation comes handy when inspecting complex components.
What’s even more exciting about the TruView™ Fusion is the wide range of configurations you can choose. The TruView™ Fusion X-Ray is a powerful platform that can be configured in 6 different ways to meet your cost and performance requirements:
TruView™ Fusion A: Load/unload samples using the system’s sliding front door.
TruView™ Fusion B: Load/unload samples using the system’s single side door via conveyor belt.
TruView™ Fusion C: Load samples using the system’s left side door and unload using right door via conveyor belt.
TruView™ Fusion S: Large field of view sensor, up to 17″x17″
TruView™ Fusion R: Reel-to-reel inspection
TruView™ Fusion X: Large format inspection to boards up to 48″x20″

Don’t hesitate to contact us for more information!

About the Author:

Dr. Bill Cardoso is the President of Creative Electron. He holds a MS and PhD degrees from the Illinois Institute of Technology (IIT) and an MBA from The University of Chicago. An industry thought leader, Bill has been recognized as IIT's 2011 Outstanding Young Alumnus Awardee for his contributions to science and technology. He is also a Senior member of the Institute of Electrical and Electronics Engineers (IEEE), Surface Mount Technology Association (SMTA), American Physics Society (APS), and the International Society for Optics and Photonics (SPIE). Bill is a holder of several patents in the areas of radiation detection, radiography, and quality inspection.

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