We’re looking forward to presenting and exhibiting at the upcoming Symposium on Counterfeit Parts and Materials. We’ll be in booth #1. Our paper “The Next Challenge For X-Ray Counterfeit Detection: Electronic Equipment” will show new challenges OEMs are facing with elaborate counterfeit schema.
For the past years our R&D team has presented new algorithms and technologies related to the use of x-ray inspection to identify counterfeit electronic components. Although a critical part of the electronic industry’s value chain, single components are not the only target of criminal enterprises. This year our presentation will focus on another equally important stage of the value chain: electronic equipment. The work presented reflects research and development of hardware, software, and algorithms needed to perform x-ray inspection of routers, switches, and other high monetary value equipment. In specific, we will focus on a case study where a number of routers and switches that were not only counterfeited, but also replaced with other electronics. X-ray images of these devices will be presented, as well as the algorithms utilized to assess the authenticity of these equipment.
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